The Nikon FX-III series features a Direct Projection
System. In a major breakthrough, this system supplies 100% of the light
to the film plane.
U-IIIR: Auto exposure; 0.1% spot, 1% spot and 35% average metering
H-III: Auto exposure; 1% spot and 35% average metering
P-III: Manual exposure
Digital Microscope Camera
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Interferometry Equipment D1/T1
The stage can be tilted in any direction using two knurled screws, enabling convenient varience in width and direction of the interference fringes. The stage also incorporate rotation and X-Y mechanical (Michelso type) motion.
The use of low-magnification TI intergerence objectives
- TI 2.5x and 5x - offers two advantages. One, the working distance is
comparatively long and two, a wide field of view can be observed with a
large depth of focus. The outstanding feature of these interference objectives
is that the center of the reference mirror is on the same optical axis
as the objective lens. Brightfield observation can also be performed immediately
by inserting a light blocking shield in front of the mirror.
CFN Filar Micrometer Eyepiece 10xA
The Eyepiece attaches directly to the eyepiece sleeve
for exact measurement of speciment sizes in combination with the objectives
(10-100x). The actual length (L) can be obtained using this formula: L
= reading / magnifing power of the objective.
For more information, call Capra at (508) 650-9700.